The effect of sample displacement on x-ray diffraction results in Bragg-Brentano geometry
Experimental Analysis of Vertical Sample Shift in Bragg-Brentano Geometry
Karol Tyc
a:1:{s:5:"en_US";s:62:"University of Warmia and Mazury, Faculty of Technical Sciences";}Abstrakt
The aim of the study was to investigate the effect of vertical displacement of the sample on the results of X-ray diffraction (XRD) in Bragg-Brentano geometry. Measurements were performed on an S275JR steel sample using a Phaser D2 diffractometer (Cu Kα, λ = 1,541874 Å) with a step size of 2θ = 0,01°. The shifts in the positions of the 2θ peaks and half-widths (FWHM) were analyzed, and the lattice constant was determined using the Nelson-Riley method, the crystallite size using the Scherrer method, and the parameters using the Williamson-Hall method. A vertical displacement of 1 mm produced an approximately 0,8° shift of the 110 peak. The Nelson-Riley method was used to determine the effect of these errors on the lattice constant (2,864-2,868 [Å]). The Scherrer method determined the size of the 110-260 [Å] order crystallites (the largest for the 110 peak), while the W-H method indicated significant lattice distortion values (approx. 0.26-0.30%). The results emphasize the need for accurate sample positioning, as shifts can lead to erroneous results and analytical conclusions.
Słowa kluczowe:
X-ray diffraction (XRD), Bragg-Brentano geometry, sample displacement, XRD geometric errorsBibliografia
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a:1:{s:5:"en_US";s:62:"University of Warmia and Mazury, Faculty of Technical Sciences";}
